Metal oxide semiconductor gated turn-off thyristor including a low lifetime region
In a depletion mode thyristor of the type including a regenerative portion (32,34,36,38) and a non-regenerative portion (32,34,34a,36a), the turn-off time for the thyristor is substantially reduced without producing a corresponding increase in the on-resistance of the device by providing a region of...
Gespeichert in:
Hauptverfasser: | , |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | In a depletion mode thyristor of the type including a regenerative portion (32,34,36,38) and a non-regenerative portion (32,34,34a,36a), the turn-off time for the thyristor is substantially reduced without producing a corresponding increase in the on-resistance of the device by providing a region of relatively low carrier lifetime (34a) in the non-regenerative portion of the device in the layer (34) or layers in which charge storage limits the turn-off time for the device. Turn-off of the thyristor is accomplished by pinching off the regenerative portion, thereby diverting current into the low carrier lifetime non-regenerative portion. |
---|