Electron beam apparatus for testing infrared detectors in a cryogenically shielded environment

An apparatus for testing infrared detectors in response to a selectively controlled electron beam within a cryogenically shielded environment includes a cryostat having an aperture which is positioned adjacent to a scanning electron microscope. An electron beam emitted from the microscope propagates...

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Bibliographische Detailangaben
Hauptverfasser:	DAHLE, ROLF N, FLESNER, LARRY D, MERRIAM, JAMES D, BATES, RICHARD L, EISENMAN, WELSEY L, ARRINGTON, DOUGLAS C
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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Beschreibung
Zusammenfassung:	An apparatus for testing infrared detectors in response to a selectively controlled electron beam within a cryogenically shielded environment includes a cryostat having an aperture which is positioned adjacent to a scanning electron microscope. An electron beam emitted from the microscope propagates through the aperture to illuminate an infrared detector mounted within the cryostat so that the detector can be tested in an environment substantially free of spurious infrared radiation.