Stress analyzer with automatic overload response

An object stress analyzing system includes a scanning head with a detector, a variable gain amplifier and a control unit which controls the scanning head and which acquires stress-related data from the amplifiers. The control unit responds to detector overload conditions by automatically adjusting t...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	BOYCE, BRADLEY R
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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Beschreibung
Zusammenfassung:	An object stress analyzing system includes a scanning head with a detector, a variable gain amplifier and a control unit which controls the scanning head and which acquires stress-related data from the amplifiers. The control unit responds to detector overload conditions by automatically adjusting the gain of the amplifier, rescanning a portion of the object and rescaling data acquired prior to occurrence of the overload condition.