Aging method for thin-film electroluminescent display panel

A method of aging a thin-film electroluminescent (EL) display element comprises the steps of applying an aging voltage to electrodes of the element, and changing the peak value of the aging voltage in accordance with the characteristics of the element which change during an aging period. An aging circuit to perform the above method is provided. In a specific example, the magnitude of the aging voltage is changed according to the relationship between the brightness of electroluminescence generated from the element and a driving voltage applied to the element. In another specific example, the magnitude of the aging voltage is changed such that the brightness of the electroluminescence is sustained to be substantially constant, thereby making operation points constant on the above characteristics.