Process and device for the generation of a linearly dependent measurement signal

Process and device for the generation of a linearly dependent measurement signal

A process which extends the measurement range of Zeeman atomic absorption spectroscopy by linearization of the calibration curve in the region of relatively high sample concentration. The intensities of the Zeeman components I pi o, I sigma o, I pi and I sigma are measured before entry into the meas...

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Hauptverfasser: OBERHEIM, WOLFGANG, HADEISHI, TETSUO
Format: Patent
Sprache:eng
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator OBERHEIM
WOLFGANG
HADEISHI
TETSUO
description A process which extends the measurement range of Zeeman atomic absorption spectroscopy by linearization of the calibration curve in the region of relatively high sample concentration. The intensities of the Zeeman components I pi o, I sigma o, I pi and I sigma are measured before entry into the measurement cell and after absorption by the measurement sample and are associated according to the formula or
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title Process and device for the generation of a linearly dependent measurement signal
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