Process and device for the generation of a linearly dependent measurement signal

Process and device for the generation of a linearly dependent measurement signal

A process which extends the measurement range of Zeeman atomic absorption spectroscopy by linearization of the calibration curve in the region of relatively high sample concentration. The intensities of the Zeeman components I pi o, I sigma o, I pi and I sigma are measured before entry into the meas...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: OBERHEIM, WOLFGANG, HADEISHI, TETSUO
Format: Patent
Sprache:eng
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:A process which extends the measurement range of Zeeman atomic absorption spectroscopy by linearization of the calibration curve in the region of relatively high sample concentration. The intensities of the Zeeman components I pi o, I sigma o, I pi and I sigma are measured before entry into the measurement cell and after absorption by the measurement sample and are associated according to the formula or