Material analysis using reflected light

An apparatus and method for determining the relative proportions of two elements of a ternary compound from light reflected off a sample of the compound. The light is varied in wavelength and a graph of reflectance vs wavelength is stored. For a given compound of general form AxB1-xC, x may be deter...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: POLLARD, JOHN H
Format: Patent
Sprache:eng
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