Material analysis using reflected light

Material analysis using reflected light

An apparatus and method for determining the relative proportions of two elements of a ternary compound from light reflected off a sample of the compound. The light is varied in wavelength and a graph of reflectance vs wavelength is stored. For a given compound of general form AxB1-xC, x may be deter...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: POLLARD, JOHN H
Format: Patent
Sprache:eng
Schlagworte:
COLORIMETRY
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT
MEASURING
PHYSICS
RADIATION PYROMETRY
TESTING
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Beschreibung
Zusammenfassung:An apparatus and method for determining the relative proportions of two elements of a ternary compound from light reflected off a sample of the compound. The light is varied in wavelength and a graph of reflectance vs wavelength is stored. For a given compound of general form AxB1-xC, x may be determined by converting the stored graph to a graph of reflectance vs photon energy of the light, determining the photon energy of the light for the longest wavelength peak on the converted graph, and computing x from the equation E1=a+bx+cx2 wherein a, b, and c are predetermined constants, and E1 is the photon energy in electron volts of the peak of interest.