Secondary-electron detector for analyzing irradiated samples for scanning electron microscopes and microprobes

A secondary-electron detector for the analysis of irradiated samples in scanning electron microscopes and microprobes, including an electron collector 12 arranged along a curved or angular path, an electron accelerator 13, a scintillator 24, a light guide 27 and a photomultiplier 28. To enable more...

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Bibliographische Detailangaben
Hauptverfasser:	RAENSCH, JUERGEN, WALKER, CLIVE T, GIACCHETTI, GIANCARLO
Format:	Patent
Sprache:	eng
Schlagworte:	APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM] BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASUREMENT OF NUCLEAR OR X-RADIATION MEASURING PHYSICS SCANNING-PROBE TECHNIQUES OR APPARATUS TESTING
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Beschreibung
Zusammenfassung:	A secondary-electron detector for the analysis of irradiated samples in scanning electron microscopes and microprobes, including an electron collector 12 arranged along a curved or angular path, an electron accelerator 13, a scintillator 24, a light guide 27 and a photomultiplier 28. To enable more effective investigation of irradiated nuclear fuels and to improve the magnification power, a spectrometer 20 and a Wehnelt cylinder 25 are provided between the accelerator and the scintillator.