Test sample support assembly

A test sample support assembly having its greatest utility in a length measuring device in a temperature controlled environment. The sample support assembly has a main support, a pair of insulating members and a sample support. In one embodiment of this invention the sample support is made of a subs...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	WOLFF, ERNEST G, ESELUN, STEVEN A
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
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Beschreibung
Zusammenfassung:	A test sample support assembly having its greatest utility in a length measuring device in a temperature controlled environment. The sample support assembly has a main support, a pair of insulating members and a sample support. In one embodiment of this invention the sample support is made of a substantially distortion-free material thereby precisely positioning the sample within the temperature controlled environment. In the other embodiment of this invention the sample support acts as the temperature controlling element. The sample support is adjustably mounted with respect to the main support. This adjustable feature permits corrective movement of the sample support to take place in order to compensate for the undesirable movement of the sample support.