Scanning beam deflection system and method
A scanning beam deflection system and method utilizes a beam scanning device for producing rays diverging from a central axis of a beam of charged particles and a deflection magnet assembly for deflecting the scanning beam substantially 270 DEG within an evacuated deflection chamber such that the de...
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| Format: | Patent |
| Sprache: | eng |
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| Zusammenfassung: | A scanning beam deflection system and method utilizes a beam scanning device for producing rays diverging from a central axis of a beam of charged particles and a deflection magnet assembly for deflecting the scanning beam substantially 270 DEG within an evacuated deflection chamber such that the deflected scanning beam exits an offset beam window in the deflection chamber and has rays diverging from the central axis of the deflected scanning beam at substantially the same angle as the diverging rays produced by the beam scanning device. The system and method is particularly useful for irradiating internal surfaces of hollow articles with the deflection chamber and deflection magnet assembly disposed along an axis of symmetry of the object. |
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