Method of diffusing aluminum into monocrystalline silicon

Uniform aluminum diffusion into monocrystalline silicon is obtained by forming a polycrystalline silicon underlayer on the surface of a monocrystalline silicon body, depositing a layer of aluminum on the polycrystalline silicon underlayer by evaporation at a temperature of less than about 250 DEG C....

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Bibliographische Detailangaben
Hauptverfasser: ROSNOWSKI, WOJCIECH, NEILSON, JOHN M S
Format: Patent
Sprache:eng
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Zusammenfassung:Uniform aluminum diffusion into monocrystalline silicon is obtained by forming a polycrystalline silicon underlayer on the surface of a monocrystalline silicon body, depositing a layer of aluminum on the polycrystalline silicon underlayer by evaporation at a temperature of less than about 250 DEG C., depositing a silicon overlayer over said aluminum layer at a temperature less than about 250 DEG C. and raising the temperature of said structure to between 900 DEG C. and 1300 DEG C. to cause the aluminum to diffuse into said monocrystalline silicon.