Object support surface and method for X-ray examination

An improved object support surface for X-ray examinations and a method for carrying out such examinations whereby a source of X-rays is positioned above the surface and an X-ray image receptor is positioned below the surface. The support surface is a highly X-ray transparent and strong material comp...

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Bibliographische Detailangaben
Hauptverfasser:	WRIGHT, RICHARD L, CANTU, ARTHUR M, KOONTZ, PAUL G
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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Beschreibung
Zusammenfassung:	An improved object support surface for X-ray examinations and a method for carrying out such examinations whereby a source of X-rays is positioned above the surface and an X-ray image receptor is positioned below the surface. The support surface is a highly X-ray transparent and strong material comprised of a fibrous material held in a plastic matrix.