Impact impulse measuring device

An impact impulse measuring device comprises, in accordance with the invention, an acceleration pick-up which transforms a mechanical shock into electric signals and is connected via an amplification unit to a unit for measuring the peak value of an impact impulse. The impact impulse measuring devic...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	RYGALIN, VIKTOR GEORGIEVICH, GRECHINSKY, DMITRY ALEXEEVICH, NOVIKOV, OLEG NIKOLAEVICH, YAKSHIN, ALEXANDR SERGEEVICH, KLOCHKO, VIKTOR ALEXANDROVICH
Format:	Patent
Sprache:	eng
Schlagworte:	INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ELECTRIC VARIABLES MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION,OR SHOCK MEASURING MAGNETIC VARIABLES PHYSICS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
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Beschreibung
Zusammenfassung:	An impact impulse measuring device comprises, in accordance with the invention, an acceleration pick-up which transforms a mechanical shock into electric signals and is connected via an amplification unit to a unit for measuring the peak value of an impact impulse. The impact impulse measuring device also includes a noise rejector comprising a counting decade connected to the output of the unit for measuring the peak value of an impact impulse, a commutator coupled to outputs of the decade, an AND NOT gate, a flip-flop and an AND gate. The outputs of the commutator are connected via the AND NOT gate to an adjusting input of the flip-flop and its output is coupled with the AND gate. Eight levels of noise protection can be set with the help of commutator contacts. The proposed impact impulse measuring device increases the accuracy of measuring the peak value of the impact impulse by eliminating noise pulses from the measuring process, increases the quality of results obtained in shock tests and reduces the expenses of such tests.