Ion illumination angle control for a mass spectrometer

A more efficient operation of a spark source mass spectrometer is achieved by adjusting the position of the spark gap with respect to the ion optical system as well as the spark gap width. The adjustment of the position of the spark gap provides a more nearly constant ion beam axis ion illumination...

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Bibliographische Detailangaben
Hauptverfasser: CONZEMIUS, ROBERT J
Format: Patent
Sprache:eng
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Zusammenfassung:A more efficient operation of a spark source mass spectrometer is achieved by adjusting the position of the spark gap with respect to the ion optical system as well as the spark gap width. The adjustment of the position of the spark gap provides a more nearly constant ion beam axis ion illumination angle so that a more constant instrument sensitivity is maintained.