Optical inspection apparatus

An optical scanning device with associated circuitry and components for identifying a defect in a transparent or translucent item by measuring the light passing qualities thereof, to determine whether such a defect is extensive enough for rejection of that item, and including means for removing that item from other such items. The present invention includes, in combination, certain known optical scanning components and circuits, specifically, a perturbation detector and a filter-discriminator circuit which are disclosed in copending appplications for United States Patents. Included with those items are other circuits for refining signal outputs from said filter-discriminator circuit to determine the acceptability of an item under inspection, and has arranged therewith, means for removing an unacceptable item from a column of passing items, completing thereby the inspection process.