ARRANGEMENT FOR NORMALIZING TWO-DIMENSIONAL PATTERN

An arrangement for normalizing a two-dimensional pattern, wherein a pattern input unit and a pattern detecting unit are respectively provided along the X-axis and Y-axis of a memory array which provides a shift function in the X- and Y-directions, and wherein said pattern detecting unit is arranged...

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Hauptverfasser: KITA Y,JA, INOSE F,JA
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:An arrangement for normalizing a two-dimensional pattern, wherein a pattern input unit and a pattern detecting unit are respectively provided along the X-axis and Y-axis of a memory array which provides a shift function in the X- and Y-directions, and wherein said pattern detecting unit is arranged at certain angles with respect to the X-axis and Y-axis of said memory array, whereby the two-dimensional pattern stored in said memory array is successively shifted in the X-direction and Y-direction so as to impart rotation to said pattern.