THIN FILM RESISTOR CONTACT

An intermediate layer of molybdenum is interposed between the aluminum interconnect layer of a semiconductor device and a thin resistive film of nickel chromium, silicon-metal, or doped silicon to prevent a reaction between the resistive film and the aluminum layer, particularly during exposure to r...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: ROBERT K. WAITS
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator ROBERT K. WAITS
description An intermediate layer of molybdenum is interposed between the aluminum interconnect layer of a semiconductor device and a thin resistive film of nickel chromium, silicon-metal, or doped silicon to prevent a reaction between the resistive film and the aluminum layer, particularly during exposure to relatively high temperatures.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US3649945A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US3649945A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US3649945A3</originalsourceid><addsrcrecordid>eNrjZJAK8fD0U3Dz9PFVCHIN9gwO8Q9ScPb3C3F0DuFhYE1LzClO5YXS3Azybq4hzh66qQX58anFBYnJqXmpJfGhwcZmJpaWJqaOxoRVAADAch-9</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>THIN FILM RESISTOR CONTACT</title><source>esp@cenet</source><creator>ROBERT K. WAITS</creator><creatorcontrib>ROBERT K. WAITS</creatorcontrib><description>An intermediate layer of molybdenum is interposed between the aluminum interconnect layer of a semiconductor device and a thin resistive film of nickel chromium, silicon-metal, or doped silicon to prevent a reaction between the resistive film and the aluminum layer, particularly during exposure to relatively high temperatures.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC ; GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS ; RESISTORS ; SEMICONDUCTOR DEVICES ; TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION ; TECHNICAL SUBJECTS COVERED BY FORMER USPC ; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS</subject><creationdate>1972</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19720314&amp;DB=EPODOC&amp;CC=US&amp;NR=3649945A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25562,76317</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19720314&amp;DB=EPODOC&amp;CC=US&amp;NR=3649945A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ROBERT K. WAITS</creatorcontrib><title>THIN FILM RESISTOR CONTACT</title><description>An intermediate layer of molybdenum is interposed between the aluminum interconnect layer of a semiconductor device and a thin resistive film of nickel chromium, silicon-metal, or doped silicon to prevent a reaction between the resistive film and the aluminum layer, particularly during exposure to relatively high temperatures.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC</subject><subject>GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS</subject><subject>RESISTORS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION</subject><subject>TECHNICAL SUBJECTS COVERED BY FORMER USPC</subject><subject>TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1972</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJAK8fD0U3Dz9PFVCHIN9gwO8Q9ScPb3C3F0DuFhYE1LzClO5YXS3Azybq4hzh66qQX58anFBYnJqXmpJfGhwcZmJpaWJqaOxoRVAADAch-9</recordid><startdate>19720314</startdate><enddate>19720314</enddate><creator>ROBERT K. WAITS</creator><scope>EVB</scope></search><sort><creationdate>19720314</creationdate><title>THIN FILM RESISTOR CONTACT</title><author>ROBERT K. WAITS</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US3649945A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1972</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC</topic><topic>GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS</topic><topic>RESISTORS</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION</topic><topic>TECHNICAL SUBJECTS COVERED BY FORMER USPC</topic><topic>TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS</topic><toplevel>online_resources</toplevel><creatorcontrib>ROBERT K. WAITS</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ROBERT K. WAITS</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>THIN FILM RESISTOR CONTACT</title><date>1972-03-14</date><risdate>1972</risdate><abstract>An intermediate layer of molybdenum is interposed between the aluminum interconnect layer of a semiconductor device and a thin resistive film of nickel chromium, silicon-metal, or doped silicon to prevent a reaction between the resistive film and the aluminum layer, particularly during exposure to relatively high temperatures.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_US3649945A
source esp@cenet
subjects BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC
GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS
RESISTORS
SEMICONDUCTOR DEVICES
TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
TECHNICAL SUBJECTS COVERED BY FORMER USPC
TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
title THIN FILM RESISTOR CONTACT
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-13T17%3A28%3A18IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=ROBERT%20K.%20WAITS&rft.date=1972-03-14&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS3649945A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true