MEASUREMENT OF SEMICONDUCTOR RESISTIVITY PROFILES BY MEASURING VOLTAGES,CALCULATING APPARENT RESISTIVITIES AND APPLYING CORRECTION FACTORS

Bibliographische Detailangaben

Hauptverfasser:	EDWARD E. GARDNER, TSU-HSING YEH, PAUL A. SCHUMANN JR, EDWARD F. GOREY
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!