Universal electronic test system for automatically making static and dynamic tests on an electronic device

1,160,968. Circuit testing. TEXAS INSTRUMENTS Inc. Aug.24, 1966 [Aug. 25, 1965], No.37969/66. Heading G1U. [Also in Divisions G3 and G4. A system for making static and dynamic voltage, current and time measurements necessary to test and classify any electronic device e. g. an integrated circuit is described in a general form which is identical with that of the system described Specification 1,160, 969, though much of the detail given in that Specification is not mentioned. The claims specifically refer to a system for carrying out both static and dynamic tests which has a test station with D. C. bias supplies pulse generator and switching arrangements for connecting the supplies and pulses to the device under test, while static and dynamic responses may be selectively taken from the device. These are passed to systems which produce pulse train signals representing the particular magnitude being measured, the pulses being counted. The system is automatically operated from a programme control.