System for quantitatively measuring one property of dielectric material by applying input signals at two different frequencies to a capacitance probe and varying one input signal to maintain a constant ratio of output signals for the two frequencies

System for quantitatively measuring one property of dielectric material by applying input signals at two different frequencies to a capacitance probe and varying one input signal to maintain a constant ratio of output signals for the two frequencies

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1. Verfasser: HANKEN ALBERT F. G
Format: Patent
Sprache:eng
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title System for quantitatively measuring one property of dielectric material by applying input signals at two different frequencies to a capacitance probe and varying one input signal to maintain a constant ratio of output signals for the two frequencies
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