System for quantitatively measuring one property of dielectric material by applying input signals at two different frequencies to a capacitance probe and varying one input signal to maintain a constant ratio of output signals for the two frequencies

Bibliographische Detailangaben

1. Verfasser:	HANKEN ALBERT F. G
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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