SYSTEMS AND METHODS FOR MATERIAL ACCRETION DETECTION AND REMOVAL

A system for monitoring at least one component is provided. The system includes at least one processor in communication with at least one memory device. The at least one processor is programmed to store a plurality of baseline information associated with the at least one component to be monitored an...

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Bibliographische Detailangaben
Hauptverfasser: Van Orman, Sam, Cuevas Alvarez, Jose Antonio, Venkataramana, Raju D, Karigiannis, John, Jain, Arpit, Boehmer, David Michael
Format: Patent
Sprache:eng
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Zusammenfassung:A system for monitoring at least one component is provided. The system includes at least one processor in communication with at least one memory device. The at least one processor is programmed to store a plurality of baseline information associated with the at least one component to be monitored and receive a plurality of current images of the at least one component to be monitored. The at least one processor is also programmed to detect a deviation from baseline based upon a comparison of the plurality of current images and the plurality of baseline information. The at least one processor is further programmed to classify the deviation and implement a corrective action based on the classification of deviation.