METERING ABNORMALITY ANALYSIS METHOD AND APPARATUS, STORAGE MEDIUM, AND COMPUTER DEVICE

METERING ABNORMALITY ANALYSIS METHOD AND APPARATUS, STORAGE MEDIUM, AND COMPUTER DEVICE

Provided are a metering abnormality analysis method and apparatus, a storage medium, and a computer device. The metering abnormality analysis method includes acquiring preliminary analysis data analyzed by a source-end system and determining at least one data filtering rule based on the preliminary...

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Bibliographische Detailangaben
Hauptverfasser: ZHANG, Jiaming, LIU, Ningtao, WAN, Shuwei, HE, Min, CHEN, Bingling, ZOU, Bo, ZHOU, Feng, XIE, Guangcheng, TAN, Shishun, LV, Xinke, XIAO, Ji, ZHENG, Ke, XU, Hongyu, CHENG, Tao
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES
PHYSICS
SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR
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Zusammenfassung:Provided are a metering abnormality analysis method and apparatus, a storage medium, and a computer device. The metering abnormality analysis method includes acquiring preliminary analysis data analyzed by a source-end system and determining at least one data filtering rule based on the preliminary analysis data (101); filtering the monitoring data of the source-end system based on the data filtering rule to obtain target metering abnormality data (102); comparing and analyzing the target metering abnormality data with preconfigured abnormal case data and determining at least one target case data from the abnormal case data (103); and performing multidimensional cluster analysis on the target metering abnormality data to obtain the aggregation level of the target metering abnormality data in multiple data dimensions and analyzing the cause of metering abnormality based on the target case data and the aggregation level (104).