APPARATUS AND METHOD FOR ASCERTAINING SAMPLING POINTS OF A SIGNAL PULSE
The present disclosure relates to a device for determining an arrival time of a signal pulse, comprising a comparison means configured such that it compares the time course of a signal pulse (V(t)) with two reference values (V1, V2) and triggers a time analysis means (TDC) of the device when the sig...
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| Format: | Patent |
| Sprache: | eng |
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| Zusammenfassung: | The present disclosure relates to a device for determining an arrival time of a signal pulse, comprising a comparison means configured such that it compares the time course of a signal pulse (V(t)) with two reference values (V1, V2) and triggers a time analysis means (TDC) of the device when the signal pulse (V(t)) reaches a reference value (V1, V2), wherein the time analysis means (TDC) is configured such that it determines the time between the first and the second triggering, and wherein the device is configured such that it determines an arrival time of the signal pulse by means of the determined time and by means of the reference values (V1,V2). The device can be used to determine an arrival time of a signal pulse in a technically simple manner. The present disclosure also relates to a method for determining an arrival time. |
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