METHOD FOR ADJUSTING THE POSITION OF PROBING BASE AND PROBING MACHINE USING THE SAME

A method for adjusting position of probing base comprises steps of providing a probing machine comprising a probing holder, a first probing base having a first probing needle comprising a plurality of first probing bodies wherein two adjacent tips of the first probing bodies h a first pitch, and a s...

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Bibliographische Detailangaben
Hauptverfasser: CHEN, CHIEN-HSUN, TSAI, SHOU-JEN, LO, YA-HUNG, TANG, FUHYUN
Format: Patent
Sprache:eng
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Zusammenfassung:A method for adjusting position of probing base comprises steps of providing a probing machine comprising a probing holder, a first probing base having a first probing needle comprising a plurality of first probing bodies wherein two adjacent tips of the first probing bodies h a first pitch, and a second probing base having a second probe comprising a plurality of second probing bodies in which two adjacent tips of the second probing bodies has a second pitch, thereafter, grabbing the first probing base and connecting the first probing base to the probing holder, acquiring first image with respect to the plurality of first probing bodies through visual identification module, and finally, adjusting roll angle of probing tips of the plurality of first needle bodies according to the first image. Alternatively, the present invention further provides a probing machine using the method for testing DUTs having different pitches.