PART SURFACE INSPECTION AND ILLUMINATION SYSTEM
An inspection system is provided. The inspection system includes a light source and a surface profile compensator. The light source illuminates a contoured surface of a part. The surface profile compensator causes light emitted from the light source to be distributed over an inspection area of the c...
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Format: | Patent |
Sprache: | eng |
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Zusammenfassung: | An inspection system is provided. The inspection system includes a light source and a surface profile compensator. The light source illuminates a contoured surface of a part. The surface profile compensator causes light emitted from the light source to be distributed over an inspection area of the contoured surface according to a target light distribution. |
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