PART SURFACE INSPECTION AND ILLUMINATION SYSTEM

An inspection system is provided. The inspection system includes a light source and a surface profile compensator. The light source illuminates a contoured surface of a part. The surface profile compensator causes light emitted from the light source to be distributed over an inspection area of the c...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Pritchard, Byron Andrew, Kommareddy, Vamshi Krishna Reddy, Hootman, Jonathan R, Choinière, Jean-Philippe, Graham, Andrew Crispin, Jeong, Younkoo, Kulkarni, Ambarish J, Blouin, Marc-André
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:An inspection system is provided. The inspection system includes a light source and a surface profile compensator. The light source illuminates a contoured surface of a part. The surface profile compensator causes light emitted from the light source to be distributed over an inspection area of the contoured surface according to a target light distribution.