Scanning System and Method for Axial Symmetric Test Objects

Axially symmetric objects may require scanning for reasons such as quality inspection, remaining life prediction, and flaw detection. Scanning systems and methods are provided for test objects that may be substantially symmetric about an axis. The scanning system may have curved supports to provide mechanical support to the test object during scanning. The curved support may reduce bending of the test object during scanning and prevent permanent deformation that may otherwise occur during the scanning process. A sensor system may be mounted (at least in part) to a mounting rail such that a sensor may move axially along the rail during a scanning process. Measurement data may be collected and analyzed to assist in determining the disposition of the test object.