APPARATUS AND METHOD FOR INSPECTING SURFACES WITH WAVELENGTH ANALYSIS

An apparatus for examining surface properties of lacquered surfaces, in particular of motor vehicles, having a first illumination device which illuminates a surface to be examined at a first illumination angle, having a second illumination device which illuminates the surface at a second illuminatio...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	Sperling, Uwe
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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