APPARATUS AND METHOD FOR INSPECTING SURFACES WITH WAVELENGTH ANALYSIS

An apparatus for examining surface properties of lacquered surfaces, in particular of motor vehicles, having a first illumination device which illuminates a surface to be examined at a first illumination angle, having a second illumination device which illuminates the surface at a second illumination angle, having a first sensor device which records radiation reflected and/or scattered by the surface illuminated by the second illumination device at a first recording angle and outputs at least one value which is characteristic of the radiation reaching the sensor device from the surface, wherein the apparatus has a radiation analysis device which analyses radiation scattered and/or reflected by the surface with regard to its wavelength.