SYSTEMS AND METHODS FOR CALIBRATION USING IMPEDANCE SIMULATION

A method and apparatus for calibrating an impedance measurement device (100a, 100b, 100c) are provided. The impedance measurement device outputs (502) a first AC signal to a phase-locked current generator (124). The phase-locked current generator generates (504) a second AC signal having a phase tha...

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Bibliographische Detailangaben
Hauptverfasser:	Chen, Liangzhu, Todorakev, Milen, Wu, Lianqun, Fan, Songnan, Gust, Jeff
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	A method and apparatus for calibrating an impedance measurement device (100a, 100b, 100c) are provided. The impedance measurement device outputs (502) a first AC signal to a phase-locked current generator (124). The phase-locked current generator generates (504) a second AC signal having a phase that is locked to a phase of the first AC signal and having an amplitude that is representative of a presented impedance having a known impedance value. The phase-locked current generator outputs the second AC signal to the impedance measurement device. The impedance measurement device performs (506) an impedance measurement based on the second AC signal to produce a measured impedance value associated with the presented impedance. The impedance measurement device is calibrated (508) based on the measured impedance value and the known impedance value of the presented impedance.