METHOD AND APPARATUS FOR USING RADIATION IMAGING DATA TO ANALYZE COMPONENTS

An example system for analyzing a component includes a radiation source configured to transmit an input radiation beam towards a component, at least a portion of the input radiation beam passing through the component as an output beam pattern; a radiation detector configured to detect the output bea...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Cernatescu, Iuliana, Pelliccione, Christopher, Breneman, Ryan, Koch, Robert, Furrer, David
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!