METHOD AND APPARATUS FOR USING RADIATION IMAGING DATA TO ANALYZE COMPONENTS

An example system for analyzing a component includes a radiation source configured to transmit an input radiation beam towards a component, at least a portion of the input radiation beam passing through the component as an output beam pattern; a radiation detector configured to detect the output beam pattern; and a beam adjustment device disposed between the radiation source and the component and configured to modify a radiation intensity profile of the input radiation beam, wherein the beam adjustment device has an adjustable radiation transparency. A method of analyzing a component is also disclosed, which includes transmitting an input radiation beam from a radiation source towards a component, at least a portion of the input radiation beam passing through the component as an output beam pattern; modifying a radiation intensity profile of the input radiation beam by passing the input radiation beam through a beam adjustment device disposed between the radiation source and the component, wherein the beam adjustment has an adjustable radiation transparency; and detecting the output beam pattern at a radiation detector.