SYSTEM HAVING SINGLE-EVENT LATCH-UP DETECTION AND MITIGATION
A method of detecting and mitigating an SEL is provided. The method includes measuring a current of a first circuit block of a semiconductor device and determining that the measured current exceeds a first threshold. In response to the measured current exceeding the first threshold, a supply voltage...
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creator | Anderson, II, Gary Edwin Moosa, Mohamed Suleman Shroff, Mehul D Dubois, Antoine Fabien Lange, George Walter |
description | A method of detecting and mitigating an SEL is provided. The method includes measuring a current of a first circuit block of a semiconductor device and determining that the measured current exceeds a first threshold. In response to the measured current exceeding the first threshold, a supply voltage of the first circuit block is reduced from a nominal voltage value to a predetermined voltage value. After reducing the supply voltage to the predetermined voltage value, the supply voltage is restored to the nominal voltage value. |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2024364342A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2024364342A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2024364342A13</originalsourceid><addsrcrecordid>eNrjZLAJjgwOcfVV8HAM8_RzVwgGEj6uuq5hrn4hCj6OIc4euqEBCi6uIa7OIZ7-fgqOfi4Kvp4hnu6OIC4PA2taYk5xKi-U5mZQdnMF6UktyI9PLS5ITE7NSy2JDw02MjAyMTYzMTYxcjQ0Jk4VALXBKos</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>SYSTEM HAVING SINGLE-EVENT LATCH-UP DETECTION AND MITIGATION</title><source>esp@cenet</source><creator>Anderson, II, Gary Edwin ; Moosa, Mohamed Suleman ; Shroff, Mehul D ; Dubois, Antoine Fabien ; Lange, George Walter</creator><creatorcontrib>Anderson, II, Gary Edwin ; Moosa, Mohamed Suleman ; Shroff, Mehul D ; Dubois, Antoine Fabien ; Lange, George Walter</creatorcontrib><description>A method of detecting and mitigating an SEL is provided. The method includes measuring a current of a first circuit block of a semiconductor device and determining that the measured current exceeds a first threshold. In response to the measured current exceeding the first threshold, a supply voltage of the first circuit block is reduced from a nominal voltage value to a predetermined voltage value. After reducing the supply voltage to the predetermined voltage value, the supply voltage is restored to the nominal voltage value.</description><language>eng</language><subject>BASIC ELECTRONIC CIRCUITRY ; ELECTRICITY ; PULSE TECHNIQUE</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20241031&DB=EPODOC&CC=US&NR=2024364342A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20241031&DB=EPODOC&CC=US&NR=2024364342A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Anderson, II, Gary Edwin</creatorcontrib><creatorcontrib>Moosa, Mohamed Suleman</creatorcontrib><creatorcontrib>Shroff, Mehul D</creatorcontrib><creatorcontrib>Dubois, Antoine Fabien</creatorcontrib><creatorcontrib>Lange, George Walter</creatorcontrib><title>SYSTEM HAVING SINGLE-EVENT LATCH-UP DETECTION AND MITIGATION</title><description>A method of detecting and mitigating an SEL is provided. The method includes measuring a current of a first circuit block of a semiconductor device and determining that the measured current exceeds a first threshold. In response to the measured current exceeding the first threshold, a supply voltage of the first circuit block is reduced from a nominal voltage value to a predetermined voltage value. After reducing the supply voltage to the predetermined voltage value, the supply voltage is restored to the nominal voltage value.</description><subject>BASIC ELECTRONIC CIRCUITRY</subject><subject>ELECTRICITY</subject><subject>PULSE TECHNIQUE</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLAJjgwOcfVV8HAM8_RzVwgGEj6uuq5hrn4hCj6OIc4euqEBCi6uIa7OIZ7-fgqOfi4Kvp4hnu6OIC4PA2taYk5xKi-U5mZQdnMF6UktyI9PLS5ITE7NSy2JDw02MjAyMTYzMTYxcjQ0Jk4VALXBKos</recordid><startdate>20241031</startdate><enddate>20241031</enddate><creator>Anderson, II, Gary Edwin</creator><creator>Moosa, Mohamed Suleman</creator><creator>Shroff, Mehul D</creator><creator>Dubois, Antoine Fabien</creator><creator>Lange, George Walter</creator><scope>EVB</scope></search><sort><creationdate>20241031</creationdate><title>SYSTEM HAVING SINGLE-EVENT LATCH-UP DETECTION AND MITIGATION</title><author>Anderson, II, Gary Edwin ; Moosa, Mohamed Suleman ; Shroff, Mehul D ; Dubois, Antoine Fabien ; Lange, George Walter</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2024364342A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2024</creationdate><topic>BASIC ELECTRONIC CIRCUITRY</topic><topic>ELECTRICITY</topic><topic>PULSE TECHNIQUE</topic><toplevel>online_resources</toplevel><creatorcontrib>Anderson, II, Gary Edwin</creatorcontrib><creatorcontrib>Moosa, Mohamed Suleman</creatorcontrib><creatorcontrib>Shroff, Mehul D</creatorcontrib><creatorcontrib>Dubois, Antoine Fabien</creatorcontrib><creatorcontrib>Lange, George Walter</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Anderson, II, Gary Edwin</au><au>Moosa, Mohamed Suleman</au><au>Shroff, Mehul D</au><au>Dubois, Antoine Fabien</au><au>Lange, George Walter</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SYSTEM HAVING SINGLE-EVENT LATCH-UP DETECTION AND MITIGATION</title><date>2024-10-31</date><risdate>2024</risdate><abstract>A method of detecting and mitigating an SEL is provided. The method includes measuring a current of a first circuit block of a semiconductor device and determining that the measured current exceeds a first threshold. In response to the measured current exceeding the first threshold, a supply voltage of the first circuit block is reduced from a nominal voltage value to a predetermined voltage value. After reducing the supply voltage to the predetermined voltage value, the supply voltage is restored to the nominal voltage value.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | BASIC ELECTRONIC CIRCUITRY ELECTRICITY PULSE TECHNIQUE |
title | SYSTEM HAVING SINGLE-EVENT LATCH-UP DETECTION AND MITIGATION |
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