SYSTEM HAVING SINGLE-EVENT LATCH-UP DETECTION AND MITIGATION

SYSTEM HAVING SINGLE-EVENT LATCH-UP DETECTION AND MITIGATION

A method of detecting and mitigating an SEL is provided. The method includes measuring a current of a first circuit block of a semiconductor device and determining that the measured current exceeds a first threshold. In response to the measured current exceeding the first threshold, a supply voltage...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Anderson, II, Gary Edwin, Moosa, Mohamed Suleman, Shroff, Mehul D, Dubois, Antoine Fabien, Lange, George Walter
Format: Patent
Sprache:eng
Schlagworte:
BASIC ELECTRONIC CIRCUITRY
ELECTRICITY
PULSE TECHNIQUE
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Beschreibung
Zusammenfassung:A method of detecting and mitigating an SEL is provided. The method includes measuring a current of a first circuit block of a semiconductor device and determining that the measured current exceeds a first threshold. In response to the measured current exceeding the first threshold, a supply voltage of the first circuit block is reduced from a nominal voltage value to a predetermined voltage value. After reducing the supply voltage to the predetermined voltage value, the supply voltage is restored to the nominal voltage value.