EFFICIENT CLEANING AND ETCHING OF HIGH ASPECT RATIO STRUCTURES

A method for treating a substrate in a processing chamber includes forming a conformal liquid layer on the substrate by concurrently supplying a vaporized solvent and a reactive gas including a halogen species to the processing chamber. The method includes forming a reactive liquid layer on the subs...

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Bibliographische Detailangaben
Hauptverfasser: KAWAGUCHI, Mark, ZHU, Ji, MUSSELWHITE, Nathan
Format: Patent
Sprache:eng
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Zusammenfassung:A method for treating a substrate in a processing chamber includes forming a conformal liquid layer on the substrate by concurrently supplying a vaporized solvent and a reactive gas including a halogen species to the processing chamber. The method includes forming a reactive liquid layer on the substrate due to the conformal liquid layer adsorbing the reactive gas and etching at least a portion of the substrate by the reactive liquid layer. The etching forms a gaseous byproduct without forming residue.