SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME

A method for fabricating semiconductor device includes the steps of forming an inter-metal dielectric (IMD) layer on a substrate, forming a trench in the IMD layer, forming a synthetic antiferromagnetic (SAF) layer in the trench, forming a metal layer on the SAF layer, planarizing the metal layer an...

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Bibliographische Detailangaben
Hauptverfasser: Lee, Yi-Hui, Chiu, Chiu-Jung, Hu, Hsiu-Hao, Chen, Yu-Chun, Shih, Yi-An, Feng, Ya-Sheng, Tseng, I-Ming, Chu, Chung-Liang
Format: Patent
Sprache:eng
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Zusammenfassung:A method for fabricating semiconductor device includes the steps of forming an inter-metal dielectric (IMD) layer on a substrate, forming a trench in the IMD layer, forming a synthetic antiferromagnetic (SAF) layer in the trench, forming a metal layer on the SAF layer, planarizing the metal layer and the SAF layer to form a metal interconnection, and forming a magnetic tunneling junction (MTJ) on the metal interconnection.