DEVICE AND METHOD FOR THE SPECTROMETRIC ANALYSIS OF SAMPLE MATERIAL

The disclosure relates to devices and methods for the spectrometric analysis of sample material located on a sample support, and in particular on a flat sample support plate, using axial time-of-flight analysis. One operating mode of the devices and methods comprises an adjustment of the pulse focal position for the abrupt ablation and/or abrupt desorption of sample material in a z-direction that is perpendicular to a tangential plane at the location of ablation and/or desorption at the sample support, and the selection of a suitable setting for an acceleration with time lag of the ablated and/or desorbed and ionized sample material onto a flight path. It can be particularly advantageous to use these devices and methods in mass spectrometry imaging (MSI). The devices and methods can, in particular, be used with laser desorption/ionization (LDI) and specifically matrix-assisted laser desorption/ionization (MALDI).