HEIGHT SENSING SYSTEM FOR ELECTRON BEAM METROLOGY TOOL

A beam of light is directed at a workpiece on a stage. The workpiece is disposed an absolute distance from an electron beam column. The beam of light that is reflected off the workpiece is received at a sensor. Using the beam of light, a nominal distance between the electron beam column and the work...

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Bibliographische Detailangaben
Hauptverfasser:	Shriyan, Sameet, Tung, Yeishin, Zhang, Mi, Zhang, Chengping, Lin, Peter
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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Beschreibung
Zusammenfassung:	A beam of light is directed at a workpiece on a stage. The workpiece is disposed an absolute distance from an electron beam column. The beam of light that is reflected off the workpiece is received at a sensor. Using the beam of light, a nominal distance between the electron beam column and the workpiece on the stage is determined.