Machine-Learning-Based Greedy Optimization Mechanism for Reducing Radio-Frequency Tests in Production

This document describes systems and techniques directed at a machine-learning-based greedy optimization mechanism for reducing radio-frequency (RF) tests in production. In aspects, a process capability index is disclosed, the process capability index used to refine a test-set. The test-set includes...

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Bibliographische Detailangaben

Hauptverfasser:	Wang, Wenxiao, Wu, Xianren, Liu, Song, Luo, Ying, Li, Yujing, Peng, Hui, Hsiao, Chen-Chun, Tseng, Chung-Cheng, Ho, Daniel Minare, Khuong, Daniel, Chang, Ren-Hua, Hsu, Chien An
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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