Machine-Learning-Based Greedy Optimization Mechanism for Reducing Radio-Frequency Tests in Production

This document describes systems and techniques directed at a machine-learning-based greedy optimization mechanism for reducing radio-frequency (RF) tests in production. In aspects, a process capability index is disclosed, the process capability index used to refine a test-set. The test-set includes tests configured to be performed on an electronic device. The process capability index is configured based on upper specification limits and lower specification limits of the electronic device for each test in the test-set, as well as results for each of the tests in the test-set. The process capability index is further configured based on a new upper specification limit and a new lower specification limit of the electronic device for a new test not in the test-set, as well as results for the new test.