AUTOMATIC ANALYSIS SYSTEM

An automatic analysis system (1) for analyzing a sample (23), the analysis system (1) comprising a first device (2) for storing cartridges (3) at a first temperature (T1), the first temperature (T1) being less than 268.15 kelvin.

Gespeichert in:

Bibliographische Detailangaben
1. Verfasser:	Patzke, Juergen
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	An automatic analysis system (1) for analyzing a sample (23), the analysis system (1) comprising a first device (2) for storing cartridges (3) at a first temperature (T1), the first temperature (T1) being less than 268.15 kelvin.