METHOD FOR CONTROLLING MASS SPECTROMETER, AND MASS SPECTROMETER

METHOD FOR CONTROLLING MASS SPECTROMETER, AND MASS SPECTROMETER

An object of the present disclosure is to provide a method for controlling a mass analyzer. According to the method, sensitivity reduction in a high ion concentration region can be prevented without changing a dwell time for each data point. In the method for controlling a mass analyzer according to...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: TOMA, Tsugunao, HASHIMOTO, Yuichiro, SUGIYAMA, Masuyuki, TAMURA, Riku, YASUDA, Hiroyuki
Format: Patent
Sprache:eng
Schlagworte:
BASIC ELECTRIC ELEMENTS
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
ELECTRICITY
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Beschreibung
Zusammenfassung:An object of the present disclosure is to provide a method for controlling a mass analyzer. According to the method, sensitivity reduction in a high ion concentration region can be prevented without changing a dwell time for each data point. In the method for controlling a mass analyzer according to the present disclosure, starting collecting data is executed at the same time interval, and a time length for collecting the data varies depending on a degree of space charge generated in a prefilter or a degree of sensitivity reduction of the mass analyzer caused by the space charge.