SYSTEM FOR LOCATING HALL EFFECT SENSOR ASSEMBLY

A system for locating a Hall Effect sensor assembly, the system broadly comprising an automated XY stage, a magnetic device, and a processor. The automated XY stage is configured to hold a Hall Effect sensor of the Hall Effect sensor assembly. The magnetic device is configured to be suspended over t...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	Regier, Bernard Keith, Mann, Lucas Alan, Morgan, Akaylia Ashliegh Kimberly, McClurg, Jonathan Andrew
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ELECTRICITY MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS PRINTED CIRCUITS TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	A system for locating a Hall Effect sensor assembly, the system broadly comprising an automated XY stage, a magnetic device, and a processor. The automated XY stage is configured to hold a Hall Effect sensor of the Hall Effect sensor assembly. The magnetic device is configured to be suspended over the XY stage such that relative movement can be effected between the magnetic device and the Hall Effect sensor. The processor is configured to query the Hall Effect sensor as the relative movement is effected, monitor an output of the Hall Effect sensor in response to the query, and identify a functional center of the Hall Effect sensor assembly based on a peak of the output of the Hall Effect sensor.