PHOTOSITE CIRCUIT USING SWITCHED OPERATIONAL PHASES
Techniques are disclosed to accurately measure the integration or accumulation of charge measured by photosite readout circuitry due to a photodiode generated current, which is generated by a photodiode as a result of impinging light reflected onto the photodiode that forms part of an imaging sensor...
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creator | Kapach, Omer Bakal, Avraham Melamud, Nadav Levy, Uriel |
description | Techniques are disclosed to accurately measure the integration or accumulation of charge measured by photosite readout circuitry due to a photodiode generated current, which is generated by a photodiode as a result of impinging light reflected onto the photodiode that forms part of an imaging sensor. The techniques described herein address shortcomings of photosite operation by using a series of sequential switching states that function to maintain the charge accumulated during idle sampling times between active detection windows. |
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The techniques described herein address shortcomings of photosite operation by using a series of sequential switching states that function to maintain the charge accumulated during idle sampling times between active detection windows.</description><language>eng</language><subject>ELECTRIC COMMUNICATION TECHNIQUE ; ELECTRICITY ; PICTORIAL COMMUNICATION, e.g. TELEVISION</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20241003&DB=EPODOC&CC=US&NR=2024334078A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20241003&DB=EPODOC&CC=US&NR=2024334078A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Kapach, Omer</creatorcontrib><creatorcontrib>Bakal, Avraham</creatorcontrib><creatorcontrib>Melamud, Nadav</creatorcontrib><creatorcontrib>Levy, Uriel</creatorcontrib><title>PHOTOSITE CIRCUIT USING SWITCHED OPERATIONAL PHASES</title><description>Techniques are disclosed to accurately measure the integration or accumulation of charge measured by photosite readout circuitry due to a photodiode generated current, which is generated by a photodiode as a result of impinging light reflected onto the photodiode that forms part of an imaging sensor. 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subjects | ELECTRIC COMMUNICATION TECHNIQUE ELECTRICITY PICTORIAL COMMUNICATION, e.g. TELEVISION |
title | PHOTOSITE CIRCUIT USING SWITCHED OPERATIONAL PHASES |
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