PHOTOSITE CIRCUIT USING SWITCHED OPERATIONAL PHASES

Techniques are disclosed to accurately measure the integration or accumulation of charge measured by photosite readout circuitry due to a photodiode generated current, which is generated by a photodiode as a result of impinging light reflected onto the photodiode that forms part of an imaging sensor...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Kapach, Omer, Bakal, Avraham, Melamud, Nadav, Levy, Uriel
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:Techniques are disclosed to accurately measure the integration or accumulation of charge measured by photosite readout circuitry due to a photodiode generated current, which is generated by a photodiode as a result of impinging light reflected onto the photodiode that forms part of an imaging sensor. The techniques described herein address shortcomings of photosite operation by using a series of sequential switching states that function to maintain the charge accumulated during idle sampling times between active detection windows.