SPECIMEN MEASUREMENT APPARATUS AND SPECIMEN MEASUREMENT METHOD

A specimen measurement apparatus includes: a specimen rack setting part configured to allow a first specimen rack and a second specimen rack to be set thereon, the first specimen rack holding a first specimen container, the second specimen rack holding a second specimen container to be subjected to...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	KATSUMI, Hironori, TADA, Masashi, OHFUCHI, Masashi
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!