SPECIMEN MEASUREMENT APPARATUS AND SPECIMEN MEASUREMENT METHOD

A specimen measurement apparatus includes: a specimen rack setting part configured to allow a first specimen rack and a second specimen rack to be set thereon, the first specimen rack holding a first specimen container, the second specimen rack holding a second specimen container to be subjected to specimen measurement in preference to the first specimen container; a first transport path through which the first specimen rack set on the specimen rack setting part is transported via a first suction position at which a specimen is to be suctioned from the first specimen container; a second transport path through which the second specimen rack set on the specimen rack setting part is transported not via the first suction position; and a measurement unit including a suction part configured to suction a specimen from the second specimen container that is present at a second suction position.