SPECIMEN MEASUREMENT APPARATUS AND SPECIMEN MEASUREMENT METHOD

SPECIMEN MEASUREMENT APPARATUS AND SPECIMEN MEASUREMENT METHOD

A specimen measurement apparatus includes: a specimen rack setting part configured to allow a first specimen rack and a second specimen rack to be set thereon, the first specimen rack holding a first specimen container, the second specimen rack holding a second specimen container to be subjected to...

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Hauptverfasser: KATSUMI, Hironori, TADA, Masashi, OHFUCHI, Masashi
Format: Patent
Sprache:eng
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator KATSUMI, Hironori
TADA, Masashi
OHFUCHI, Masashi
description A specimen measurement apparatus includes: a specimen rack setting part configured to allow a first specimen rack and a second specimen rack to be set thereon, the first specimen rack holding a first specimen container, the second specimen rack holding a second specimen container to be subjected to specimen measurement in preference to the first specimen container; a first transport path through which the first specimen rack set on the specimen rack setting part is transported via a first suction position at which a specimen is to be suctioned from the first specimen container; a second transport path through which the second specimen rack set on the specimen rack setting part is transported not via the first suction position; and a measurement unit including a suction part configured to suction a specimen from the second specimen container that is present at a second suction position.
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title SPECIMEN MEASUREMENT APPARATUS AND SPECIMEN MEASUREMENT METHOD
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