X-RAY INSPECTION APPARATUS AND X-RAY INSPECTION SYSTEM
To provide an X-ray inspection apparatus capable of obtaining a clear transmission image with less noise without reducing a conveyance speed of an inspection object. There is provided an X-ray inspection apparatus in which an X-ray generator and an X-ray detector are disposed to face each other with...
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Format: | Patent |
Sprache: | eng |
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Zusammenfassung: | To provide an X-ray inspection apparatus capable of obtaining a clear transmission image with less noise without reducing a conveyance speed of an inspection object. There is provided an X-ray inspection apparatus in which an X-ray generator and an X-ray detector are disposed to face each other with a conveyance path interposed between the X-ray generator and the X-ray detector, conveyance path through which inspection objects that are sequentially conveyed pass. The X-ray generator and the X-ray detector are configured to move back and forth in a conveyance direction of the inspection object and an opposite direction thereof. The X-ray detector captures an image of the inspection object while the X-ray generator and the X-ray detector moves in the conveyance direction from an image capturing start position to an image capturing end position at a speed equal to the conveyance speed of the inspection object. |
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